Literature DB >> 15772655

Current measurement by real-time counting of single electrons.

Jonas Bylander1, Tim Duty, Per Delsing.   

Abstract

The fact that electrical current is carried by individual charges has been known for over 100 years, yet this discreteness has not been directly observed so far. Almost all current measurements involve measuring the voltage drop across a resistor, using Ohm's law, in which the discrete nature of charge does not come into play. However, by sending a direct current through a microelectronic circuit with a chain of islands connected by small tunnel junctions, the individual electrons can be observed one by one. The quantum mechanical tunnelling of single charges in this one-dimensional array is time correlated, and consequently the detected signal has the average frequency f = I/e, where I is the current and e is the electron charge. Here we report a direct observation of these time-correlated single-electron tunnelling oscillations, and show electron counting in the range 5 fA-1 pA. This represents a fundamentally new way to measure extremely small currents, without offset or drift. Moreover, our current measurement, which is based on electron counting, is self-calibrated, as the measured frequency is related to the current only by a natural constant.

Year:  2005        PMID: 15772655     DOI: 10.1038/nature03375

Source DB:  PubMed          Journal:  Nature        ISSN: 0028-0836            Impact factor:   49.962


  6 in total

1.  Universal oscillations in counting statistics.

Authors:  C Flindt; C Fricke; F Hohls; T Novotny; K Netocny; T Brandes; R J Haug
Journal:  Proc Natl Acad Sci U S A       Date:  2009-06-10       Impact factor: 11.205

2.  Measurement of finite-frequency current statistics in a single-electron transistor.

Authors:  Niels Ubbelohde; Christian Fricke; Christian Flindt; Frank Hohls; Rolf J Haug
Journal:  Nat Commun       Date:  2012-01-03       Impact factor: 14.919

3.  Sensitivity and 3 dB Bandwidth in Single and Series-Connected Tunneling Magnetoresistive Sensors.

Authors:  Michał Dąbek; Piotr Wiśniowski; Tomasz Stobiecki; Jerzy Wrona; Susana Cardoso; Paulo P Freitas
Journal:  Sensors (Basel)       Date:  2016-10-31       Impact factor: 3.576

4.  Detector-induced backaction on the counting statistics of a double quantum dot.

Authors:  Zeng-Zhao Li; Chi-Hang Lam; Ting Yu; J Q You
Journal:  Sci Rep       Date:  2013-10-23       Impact factor: 4.379

5.  Spatial and temporal distribution of phase slips in Josephson junction chains.

Authors:  Adem Ergül; Thomas Weißl; Jan Johansson; Jack Lidmar; David B Haviland
Journal:  Sci Rep       Date:  2017-09-13       Impact factor: 4.379

6.  Electrometry by optical charge conversion of deep defects in 4H-SiC.

Authors:  G Wolfowicz; S J Whiteley; D D Awschalom
Journal:  Proc Natl Acad Sci U S A       Date:  2018-07-16       Impact factor: 11.205

  6 in total

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