Application of TOF-SIMS with chemometrics to discriminate between four different yeast strains from the species Candida glabrata and Saccharomyces cerevisiae.

We present a TOF-SIMS analysis of the cell surface differences between four yeast strains from two species, Candida glabrata and Saccharomyces cerevisiae (haploid strains BY4742 and BY4741 and the derived diploid BY4743). The study assesses the suitability of TOF-SIMS analysis in combination with statistical methods (principal component analysis, Fisher's discriminant analysis, and cluster analysis) for the discrimination between the four yeast strains. We demonstrate that a combination of these statistical methods identifies 34 ions, from a total data set of 1200, which can be used to distinguish between the four yeasts. The study discusses the assignments of surface cell membrane phospholipids for the identified ions and the resulting differences in the phospholipid pattern between the four yeasts, particularly in relation to ploidy and budding pattern. The method shows that fatty acids, phosphatidylglycerols, phosphatidylethanolamines, phosphatidylserines, and phosphatidylcholines, as well as cardiolipins, are of diagnostic importance.