| Literature DB >> 15755132 |
Ad M J van der Eerden1, Tom Visser, T Alexander Nijhuis, Yasuo Ikeda, Muriel Lepage, Diek C Koningsberger, Bert M Weckhuysen.
Abstract
Atomic XAFS is a very attractive technique for probing electronic properties of supported metal nanoclusters. For platinum nanoparticles on different supports, the technique is found to be in good agreement with infrared CO adsorption measurements. The advantages of AXAFS, however, are that no probe molecule is required and that real-time measurements under reaction conditions are possible.Entities:
Year: 2005 PMID: 15755132 DOI: 10.1021/ja043107l
Source DB: PubMed Journal: J Am Chem Soc ISSN: 0002-7863 Impact factor: 15.419