| Literature DB >> 15727492 |
Wei-Chin Hwang1, Chi-Ah Chun, David T Takeuchi, Hector F Myers, Prabha Siddarth.
Abstract
Using data from the Chinese American Epidemiological Study, risk for experiencing an initial episode of major depression across the life course was examined. Data were collected on 1,747 U.S.-born and foreign-born Chinese Americans (ages 18-65 years). Results suggest that Chinese American women did not evidence higher risk than Chinese American men for experiencing a 1st major depressive episode. Risk for experiencing a 1st depressive episode decreased as length of residence in the United States increased. Although those who immigrated at younger ages evidenced greater overall risk, those who came at later ages were more likely to become depressed at or soon after arrival. Competing theories of acculturation-related risk are discussed and directions for future research are proposed. ((c) 2005 APA, all rights reserved).Entities:
Mesh:
Year: 2005 PMID: 15727492 DOI: 10.1037/1099-9809.11.1.16
Source DB: PubMed Journal: Cultur Divers Ethnic Minor Psychol ISSN: 1077-341X