| Literature DB >> 15698121 |
Tuson Park1, Z Nussinov, K R A Hazzard, V A Sidorov, A V Balatsky, J L Sarrao, S-W Cheong, M F Hundley, Jang-Sik Lee, Q X Jia, J D Thompson.
Abstract
The low-frequency dielectric response of hole-doped insulators La(2)Cu(1-x)Li(x)O(4) and La(2-x)Sr(x)NiO(4) shows a large dielectric constant epsilon(') at high temperature and a steplike drop by a factor of 100 at a material-dependent low temperature T(f). T(f) increases with frequency, and the dielectric response shows universal scaling in a Cole-Cole plot, suggesting that a charge-glass state is realized both in the cuprates and in the nickelates.Entities:
Year: 2005 PMID： 15698121 DOI： 10.1103/PhysRevLett.94.017002
Source DB: PubMed Journal: Phys Rev Lett ISSN： 0031-9007 Impact factor: 9.161