| Literature DB >> 15694679 |
Noël Bonnet1, Danielle Nuzillard.
Abstract
A complementary approach is proposed for analysing series of electron energy-loss spectra that can be recorded with the spectrum-line technique, across an interface for instance. This approach, called blind source separation (BSS) or independent component analysis (ICA), complements two existing methods: the spatial difference approach and multivariate statistical analysis. The principle of the technique is presented and illustrations are given through one simulated example and one real example.Year: 2005 PMID: 15694679 DOI: 10.1016/j.ultramic.2004.11.003
Source DB: PubMed Journal: Ultramicroscopy ISSN: 0304-3991 Impact factor: 2.689