Literature DB >> 15694679

Independent component analysis: a new possibility for analysing series of electron energy loss spectra.

Noël Bonnet1, Danielle Nuzillard.   

Abstract

A complementary approach is proposed for analysing series of electron energy-loss spectra that can be recorded with the spectrum-line technique, across an interface for instance. This approach, called blind source separation (BSS) or independent component analysis (ICA), complements two existing methods: the spatial difference approach and multivariate statistical analysis. The principle of the technique is presented and illustrations are given through one simulated example and one real example.

Year:  2005        PMID: 15694679     DOI: 10.1016/j.ultramic.2004.11.003

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  3 in total

1.  Application of machine learning techniques to electron microscopic/spectroscopic image data analysis.

Authors:  Shunsuke Muto; Motoki Shiga
Journal:  Microscopy (Oxf)       Date:  2020-04-08       Impact factor: 1.571

2.  Evaluation of EELS spectrum imaging data by spectral components and factors from multivariate analysis.

Authors:  Siyuan Zhang; Christina Scheu
Journal:  Microscopy (Oxf)       Date:  2018-03-01       Impact factor: 1.571

3.  Towards calibration-invariant spectroscopy using deep learning.

Authors:  M Chatzidakis; G A Botton
Journal:  Sci Rep       Date:  2019-02-14       Impact factor: 4.379

  3 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.