| Literature DB >> 15624101 |
Volker Hoffmann1, Martin Kasik, Peter K Robinson, Cornel Venzago.
Abstract
Over the past twenty years or so, glow discharge mass spectrometry (GDMS) has become the industry standard for the analysis of trace elements in metals and semiconductors. A review of its history is followed by a picture of the present situation and a look to where the future may lie. Applications are summarised, including the ability of GDMS to offer depth-resolved data and non-conductor analysis, and the well-documented quantitative nature of the results is reviewed. The effects resulting from the physical properties of the analyte material are discussed at length. Finally, recent work such as "fast flow" sources and pulsed glow discharges is reviewed.Year: 2004 PMID: 15624101 DOI: 10.1007/s00216-004-2933-2
Source DB: PubMed Journal: Anal Bioanal Chem ISSN: 1618-2642 Impact factor: 4.142