| Literature DB >> 15576617 |
A Ziegler1, J C Idrobo, M K Cinibulk, C Kisielowski, N D Browning, R O Ritchie.
Abstract
Direct atomic resolution images have been obtained that illustrate how a range of rare-earth atoms bond to the interface between the intergranular phase and the matrix grains in an advanced silicon nitride ceramic. It has been found that each rare-earth atom bonds to the interface at a different location, depending on atom size, electronic configuration, and the presence of oxygen at the interface. This is the key factor to understanding the origin of the mechanical properties in these ceramics and will enable precise tailoring in the future to critically improve the materials' performance in wide-ranging applications.Entities:
Year: 2004 PMID: 15576617 DOI: 10.1126/science.1104173
Source DB: PubMed Journal: Science ISSN: 0036-8075 Impact factor: 47.728