| Literature DB >> 15556695 |
Irma Kuljanishvili1, Subhasish Chakraborty, I J Maasilta, S H Tessmer, M R Melloch.
Abstract
We present a numerical method to model electric-field-sensitive scanning probe microscopy measurements which allows for a tip of arbitrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.Mesh：
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Year: 2004 PMID： 15556695 DOI： 10.1016/j.ultramic.2004.07.004
Source DB: PubMed Journal: Ultramicroscopy ISSN： 0304-3991 Impact factor: 2.689