Optimal-sensitivity analysis of ion channel gating kinetics.

We propose a new approach to analysis of kinetic models for ion channel gating, based on application of fluctuating voltages through a voltage clamp, in addition to conventional techniques. We show that the channel kinetics can be probed in a much more sensitive way, leading to more efficient model selection and more reliable estimates of model parameters. We use wavelet transform as an analytic tool for fluctuating currents and parametric dispersion plots as a measure of model compatibility with experimental data.