Inference from accelerated degradation and failure data based on Gaussian process models.

An important problem in reliability and survival analysis is that of modeling degradation together with any observed failures in a life test. Here, based on a continuous cumulative damage approach with a Gaussian process describing degradation, a general accelerated test model is presented in which failure times and degradation measures can be combined for inference about system lifetime. Some specific models when the drift of the Gaussian process depends on the acceleration variable are discussed in detail. Illustrative examples using simulated data as well as degradation data observed in carbon-film resistors are presented.