| Literature DB >> 15267568 |
Z-B Wu1, D J Diestler, R Feng, X C Zeng.
Abstract
A technique that melds an atomistic description of the interfacial region with a coarse-grained description of the far regions of the solid substrates is presented and applied to a two-dimensional model contact consisting of planar solid substrates separated by a monolayer fluid film. The hybrid method yields results in excellent agreement with the "exact" (i.e., fully atomistic) results. The importance of a proper accounting for the elastic response of the substrates, which is reliably and efficiently accomplished through coarse-graining of the far regions, is demonstrated. (c) 2004 American Institute of PhysicsEntities:
Year: 2004 PMID: 15267568 DOI: 10.1063/1.1667474
Source DB: PubMed Journal: J Chem Phys ISSN: 0021-9606 Impact factor: 3.488