Literature DB >> 15263614

X-ray diffraction with a Bragg angle near pi/2 and its applications.

S Kikuta1, Y Imai, T Iizuka, Y Yoda, X W Zhang, K Hirano.   

Abstract

X-ray dynamical diffraction phenomena at a Bragg angle near pi/2 are studied. The X-ray transmissivity as well as the reflectivity from the (991) lattice plane of a silicon thin plate is observed. It agrees fairly well with the diffraction pattern calculated on the basis of the Darwin approach. The possibility is discussed whether a set of two crystal plates arranged face to face, in which the diffraction condition with a Bragg angle near pi/2 is satisfied, may be used as a very high resolution monochromator.

Entities:  

Year:  1998        PMID: 15263614     DOI: 10.1107/S0909049597018621

Source DB:  PubMed          Journal:  J Synchrotron Radiat        ISSN: 0909-0495            Impact factor:   2.616


  1 in total

1.  Measurement of single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π.

Authors:  P V Gureva; N V Marchenkov; A N Artemev; N A Artemiev; A D Belyaev; A A Demkiv; V A Shishkov
Journal:  J Appl Crystallogr       Date:  2020-05-13       Impact factor: 3.304

  1 in total

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