Literature DB >> 15263253

Edge-jump inversion in the Si L3,2-edge optical XAFS of porous silicon.

T K Sham1, I Coulthard.   

Abstract

Entities:  

Year:  1999        PMID： 15263253     DOI： 10.1107/S0909049599001314

Source DB:  PubMed          Journal:  J Synchrotron Radiat        ISSN： 0909-0495            Impact factor:   2.616


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  1 in total

1.  Surface deep profile synchrotron studies of mechanically modified top-down silicon nanowires array using ultrasoft X-ray absorption near edge structure spectroscopy.

Authors:  S Yu Turishchev; E V Parinova; A K Pisliaruk; D A Koyuda; D Yermukhamed; T Ming; R Ovsyannikov; D Smirnov; A Makarova; V Sivakov
Journal:  Sci Rep       Date:  2019-05-30       Impact factor: 4.379
  1 in total

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