Literature DB >> 15258397

Synchrotron X-ray and ab initio studies of beta-Si3N4.

D du Boulay1, N Ishizawa, T Atake, V Streltsov, K Furuya, F Munakata.   

Abstract

Almost absorption- and extinction-free single-crystal synchrotron X-ray diffraction data were measured at 150, 200 and 295 K for beta-Si3N4, silicon nitride, at a wavelength of 0.7 A. The true symmetry of this material has been the subject of minor controversy for several decades. No compelling evidence favouring the low-symmetry P6(3) model was identified in this study.

Entities:  

Year:  2004        PMID: 15258397     DOI: 10.1107/S010876810401393X

Source DB:  PubMed          Journal:  Acta Crystallogr B        ISSN: 0108-7681


  3 in total

1.  Detection of sub-atomic movement in nanostructures.

Authors:  Tongjun Liu; Jun-Yu Ou; Kevin F MacDonald; Nikolay I Zheludev
Journal:  Nanoscale Adv       Date:  2021-02-25

2.  La3Si6N11.

Authors:  Hisanori Yamane; Toshiki Nagura; Tomohiro Miyazaki
Journal:  Acta Crystallogr Sect E Struct Rep Online       Date:  2014-05-03

3.  29Si NMR Chemical Shifts in Crystalline and Amorphous Silicon Nitrides.

Authors:  Ilia Ponomarev; Peter Kroll
Journal:  Materials (Basel)       Date:  2018-09-07       Impact factor: 3.623

  3 in total

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