Literature DB >> 15247474

Watching the growth of bulk grains during recrystallization of deformed metals.

S Schmidt1, S F Nielsen, C Gundlach, L Margulies, X Huang, D Juul Jensen.   

Abstract

We observed the in situ growth of a grain during recrystallization in the bulk of a deformed sample. We used the three-dimensional x-ray diffraction microscope located at the European Synchrotron Radiation Facility in Grenoble, France. The results showed a very heterogeneous growth pattern, contradicting the classical assumption of smooth and spherical growth of new grains during recrystallization. This type of in situ bulk measurement opens up the possibility of obtaining experimental data on scientific topics that before could only be analyzed theoretically on the basis of the statistical characterization of microstructures. For recrystallization, the in situ method includes direct measurements of nucleation and boundary migration through a deformed matrix.

Year:  2004        PMID: 15247474     DOI: 10.1126/science.1098627

Source DB:  PubMed          Journal:  Science        ISSN: 0036-8075            Impact factor:   47.728


  11 in total

1.  Coherent X-ray diffraction imaging of strain at the nanoscale.

Authors:  Ian Robinson; Ross Harder
Journal:  Nat Mater       Date:  2009-04       Impact factor: 43.841

2.  Direct tomography with chemical-bond contrast.

Authors:  Simo Huotari; Tuomas Pylkkänen; Roberto Verbeni; Giulio Monaco; Keijo Hämäläinen
Journal:  Nat Mater       Date:  2011-05-29       Impact factor: 43.841

3.  Direct observation of grain rotations during coarsening of a semisolid Al-Cu alloy.

Authors:  Jules M Dake; Jette Oddershede; Henning O Sørensen; Thomas Werz; J Cole Shatto; Kentaro Uesugi; Søren Schmidt; Carl E Krill
Journal:  Proc Natl Acad Sci U S A       Date:  2016-09-26       Impact factor: 11.205

4.  Grain rotation and lattice deformation during photoinduced chemical reactions revealed by in situ X-ray nanodiffraction.

Authors:  Zhifeng Huang; Matthias Bartels; Rui Xu; Markus Osterhoff; Sebastian Kalbfleisch; Michael Sprung; Akihiro Suzuki; Yukio Takahashi; Thomas N Blanton; Tim Salditt; Jianwei Miao
Journal:  Nat Mater       Date:  2015-06-08       Impact factor: 43.841

5.  A GREEDY METHOD FOR RECONSTRUCTING POLYCRYSTALS FROM THREE-DIMENSIONAL X-RAY DIFFRACTION DATA.

Authors:  Arun K Kulshreshth; Andreas Alpers; Gabor T Herman; Erik Knudsen; Lajos Rodek; Henning F Poulsen
Journal:  Inverse Probl Imaging (Springfield)       Date:  2009-02-01       Impact factor: 1.639

6.  X-ray diffraction imaging of metal-oxide epitaxial tunnel junctions made by optical lithography: use of focused and unfocused X-ray beams.

Authors:  Cristian Mocuta; Antoine Barbier; Stefan Stanescu; Sylvia Matzen; Jean Baptiste Moussy; Eric Ziegler
Journal:  J Synchrotron Radiat       Date:  2013-01-19       Impact factor: 2.616

7.  Dark-field X-ray microscopy for multiscale structural characterization.

Authors:  H Simons; A King; W Ludwig; C Detlefs; W Pantleon; S Schmidt; I Snigireva; A Snigirev; H F Poulsen
Journal:  Nat Commun       Date:  2015-01-14       Impact factor: 14.919

8.  Boundary migration in a 3D deformed microstructure inside an opaque sample.

Authors:  Y B Zhang; J D Budai; J Z Tischler; W Liu; R Xu; E R Homer; A Godfrey; D Juul Jensen
Journal:  Sci Rep       Date:  2017-06-30       Impact factor: 4.379

9.  Direct observation of nucleation in the bulk of an opaque sample.

Authors:  Chaoling Xu; Yubin Zhang; Andrew Godfrey; Guilin Wu; Wenjun Liu; Jonathan Z Tischler; Qing Liu; Dorte Juul Jensen
Journal:  Sci Rep       Date:  2017-02-14       Impact factor: 4.379

10.  Using electric current to surpass the microstructure breakup limit.

Authors:  Rongshan Qin
Journal:  Sci Rep       Date:  2017-01-25       Impact factor: 4.379

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