| Literature DB >> 15245107 |
Jörg Hachenberg1, Christoph Streng, Erik Süske, Sebastian Vauth, S G Mayr, Hans-Ulrich Krebs, Konrad Samwer.
Abstract
The crossover in kinetic roughening of thin films from a particle-character-dominated regime to continuous growth behavior has been observed in this work. This has been accomplished by atomic force microscopy investigations of pulsed laser deposited amorphous organic films with thicknesses ranging from several nanometers to more than 4 microm. The early-stage random-deposition-like processes end once a closed layer is formed, which grows without saturation on the characteristic length scales. In addition, the influence of oblique film deposition has been examined and interpreted.Entities:
Year: 2004 PMID: 15245107 DOI: 10.1103/PhysRevLett.92.246102
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161