Literature DB >> 15169294

Formation of thermal vacancies on the Si sublattice of the intermetallic compound MoSi2.

X Y Zhang1, W Sprengel, T E M Staab, H Inui, H-E Schaefer.   

Abstract

For a detailed understanding of high-temperature processes in complex solids the identification of the sublattice on which thermal defects are formed is of basic interest. Theoretical studies in intermetallic compounds favor a particular sublattice for thermal vacancy formation. In the present study we detect in ordered MoSi2 thermal vacancies with a low formation enthalpy of H(F)(V)=(1.6+/-0.1) eV, and we succeed in showing by experimental and theoretical efforts that they are preferentially formed on the Si sublattice. By these data self-diffusion in MoSi2 can be understood.

Entities:  

Year:  2004        PMID: 15169294     DOI: 10.1103/PhysRevLett.92.155502

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  1 in total

1.  Reversible atomic processes as basic mechanisms of the glass transition.

Authors:  Feng Ye; Wolfgang Sprengel; Rainer K Wunderlich; Hans-Jörg Fecht; Hans-Eckhardt Schaefer
Journal:  Proc Natl Acad Sci U S A       Date:  2007-07-30       Impact factor: 11.205

  1 in total

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