Literature DB >> 15149720

JECP/PCED--a computer program for simulation of polycrystalline electron diffraction pattern and phase identification.

X Z Li1.   

Abstract

A computer program for simulation of polycrystalline electron diffraction pattern and phase identification is described. In addition to simulating electron diffraction pattern for a single phase, the program has the ability to model two phases with selected mass ratio. Experimental polycrystalline electron diffraction patterns can be directly compared to simulated patterns for phase identification. Examples of how to use the program are also given. Copyright 2004 Elsevier B.V.

Entities:  

Year:  2004        PMID: 15149720     DOI: 10.1016/j.ultramic.2004.01.006

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  1 in total

1.  Four-dimensional ultrafast electron microscopy of phase transitions.

Authors:  Michael S Grinolds; Vladimir A Lobastov; Jonas Weissenrieder; Ahmed H Zewail
Journal:  Proc Natl Acad Sci U S A       Date:  2006-11-27       Impact factor: 11.205

  1 in total

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