| Literature DB >> 15093935 |
Bradley H Frazer1, Marco Girasole, Lisa M Wiese, Torsten Franz, Gelsomina De Stasio.
Abstract
Several X-ray PhotoElectron Emission spectroMicroscopes (X-PEEMs) exist around the world at this time. We present recent performance and resolution tests of one of them, the Spectromicroscope for PHotoelectron Imaging of Nanostructures with X-rays (SPHINX) X-PEEM, installed at the University of Wisconsin Synchrotron Radiation Center. With this state-of-the-art instrument we demonstrate chemical analysis capabilities on conducting and insulating specimens of diverse interests, and an unprecedented lateral resolution of 10 nm with monochromatic X-rays and 7.2 nm with ultraviolet illumination.Entities:
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Year: 2004 PMID: 15093935 DOI: 10.1016/j.ultramic.2003.10.001
Source DB: PubMed Journal: Ultramicroscopy ISSN: 0304-3991 Impact factor: 2.689