Literature DB >> 15089559

Sublattice identification in scanning force microscopy on alkali halide surfaces.

R Hoffmann1, L N Kantorovich, A Baratoff, H J Hug, H-J Güntherodt.   

Abstract

We propose and apply to the KBr(001) surface a new procedure for species recognition in scanning force microscopy (SFM) of ionic crystal surfaces which show a high symmetry of the charge arrangement. The method is based on a comparison between atomistic simulations and site-specific frequency versus distance measurements. First, by taking the difference of force-distance curves extracted at a few judiciously chosen surface sites we eliminate site-independent long-range forces. The obtained short-range force differences are then compared with calculated ones assuming plausible tip apex models. This procedure allows for the first time identification of the tip apex polarity and of the positive and negative sublattices in SFM images of the (001) cleavage surface of an ionic crystal with the rock salt structure.

Entities:  

Year:  2004        PMID: 15089559     DOI: 10.1103/PhysRevLett.92.146103

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  7 in total

1.  Atomic force microscopy as a tool for atom manipulation.

Authors:  Oscar Custance; Ruben Perez; Seizo Morita
Journal:  Nat Nanotechnol       Date:  2009-12       Impact factor: 39.213

2.  Quantifying the evolution of atomic interaction of a complex surface with a functionalized atomic force microscopy tip.

Authors:  Alexander Liebig; Prokop Hapala; Alfred J Weymouth; Franz J Giessibl
Journal:  Sci Rep       Date:  2020-08-24       Impact factor: 4.379

3.  Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction.

Authors:  Mehmet Z Baykara; Omur E Dagdeviren; Todd C Schwendemann; Harry Mönig; Eric I Altman; Udo D Schwarz
Journal:  Beilstein J Nanotechnol       Date:  2012-09-11       Impact factor: 3.649

4.  Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM.

Authors:  Fabien Castanié; Laurent Nony; Sébastien Gauthier; Xavier Bouju
Journal:  Beilstein J Nanotechnol       Date:  2012-04-02       Impact factor: 3.649

5.  Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting.

Authors:  Hongqian Sang; Samuel P Jarvis; Zhichao Zhou; Peter Sharp; Philip Moriarty; Jianbo Wang; Yu Wang; Lev Kantorovich
Journal:  Sci Rep       Date:  2014-10-20       Impact factor: 4.379

6.  Anchoring of a dye precursor on NiO(001) studied by non-contact atomic force microscopy.

Authors:  Sara Freund; Antoine Hinaut; Nathalie Marinakis; Edwin C Constable; Ernst Meyer; Catherine E Housecroft; Thilo Glatzel
Journal:  Beilstein J Nanotechnol       Date:  2018-01-23       Impact factor: 3.649

7.  Defect mediated manipulation of nanoclusters on an insulator.

Authors:  Teemu Hynninen; Gregory Cabailh; Adam S Foster; Clemens Barth
Journal:  Sci Rep       Date:  2013       Impact factor: 4.379

  7 in total

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