| Literature DB >> 15089154 |
Uwe Falke1, Andrew Bleloch, Meiken Falke, Steffen Teichert.
Abstract
Nickel disilicide/silicon (001) interfaces were investigated by aberration corrected scanning transmission electron microscopy (STEM). The atomic structure was derived directly from the high spatial resolution high angle annular dark field STEM images without recourse to image simulation. It comprises fivefold coordinated silicon and sevenfold coordinated nickel sites at the interface and shows a 2 x 1 reconstruction. The proposed structure has not been experimentally observed before but has been recently predicted theoretically by others to be energetically favored.Entities:
Year: 2004 PMID: 15089154 DOI: 10.1103/PhysRevLett.92.116103
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161