Literature DB >> 15089154

Atomic structure of a (2 x 1) reconstructed NiSi2/Si(001) interface.

Uwe Falke1, Andrew Bleloch, Meiken Falke, Steffen Teichert.   

Abstract

Nickel disilicide/silicon (001) interfaces were investigated by aberration corrected scanning transmission electron microscopy (STEM). The atomic structure was derived directly from the high spatial resolution high angle annular dark field STEM images without recourse to image simulation. It comprises fivefold coordinated silicon and sevenfold coordinated nickel sites at the interface and shows a 2 x 1 reconstruction. The proposed structure has not been experimentally observed before but has been recently predicted theoretically by others to be energetically favored.

Entities:  

Year:  2004        PMID: 15089154     DOI: 10.1103/PhysRevLett.92.116103

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  3 in total

1.  Atomap: a new software tool for the automated analysis of atomic resolution images using two-dimensional Gaussian fitting.

Authors:  Magnus Nord; Per Erik Vullum; Ian MacLaren; Thomas Tybell; Randi Holmestad
Journal:  Adv Struct Chem Imaging       Date:  2017-02-13

2.  Ni-mediated reactions in nanocrystalline diamond on Si substrates: the role of the oxide barrier.

Authors:  Semir Tulić; Thomas Waitz; Oleksandr Romanyuk; Marián Varga; Mária Čaplovičová; Gerlinde Habler; Viliam Vretenár; Mário Kotlár; Alexander Kromka; Bohuslav Rezek; Viera Skákalová
Journal:  RSC Adv       Date:  2020-02-26       Impact factor: 4.036

3.  Face Dependence of Schottky Barriers Heights of Silicides and Germanides on Si and Ge.

Authors:  Hongfei Li; Yuzheng Guo; John Robertson
Journal:  Sci Rep       Date:  2017-11-30       Impact factor: 4.379

  3 in total

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