| Literature DB >> 15067508 |
Zengyan Zhang1, Jingsheng Xu, Qinjuan Xu, Philip Larkin, Zhiyong Xin.
Abstract
The distal segment of the long arm of the Thinopyrum intermedium chromosome 7Ai1 carries the barley yellow dwarf virus (BYDV) resistance gene Bdv2. This segment was transferred to the distal region of the long arm of wheat chromosome 7D in the Yw series of translocation lines by using the ph1b mutant to induce homoeologous pairing. To transfer Bdv2 to commercial varieties, we developed two resistance gene-analog polymorphism (RGAP) markers, Tgp-1(350) and Tgp-2(210), and one randomly amplified polymorphic DNA (RAPD) marker, OPD04(1300). The diagnostic fragments of the RGAP marker Tgp-1(350) and the RAPD marker OPD04(1300) were cloned, sequenced and converted into sequence-characterized amplified region (SCAR) markers, named SC-gp1 and SC-D04, respectively. SC-gp1 and SC-D04 were validated based on available translocation lines and segregating F(2) individuals. Our results indicated that the SCAR markers co-segregated with the BYDV resistance associated with Bdv2. Therefore, they can be used as a low-cost, high-throughput alternative to conventional phenotypic screening in wheat-breeding programs exploiting Bdv2. The marker-assisted selection for BYDV resistance was successfully performed in a wheat-breeding program.Entities:
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Year: 2004 PMID： 15067508 DOI： 10.1007/s00122-004-1649-1
Source DB: PubMed Journal: Theor Appl Genet ISSN： 0040-5752 Impact factor: 5.699