| Literature DB >> 15046811 |
T Yamazaki1, N Nakanishi, A Recnik, M Kawasaki, K Watanabe, M Ceh, M Shiojiri.
Abstract
[Formula: see text] -doped ZnO crystals including inversion boundaries were investigated by high-resolution high-angle annular-dark field (HAADF) scanning transmission electron microscopy (STEM). The images were analysed with the aid of the image simulation based on Bethe method and also the retrieval processing using deconvolution. Utility of these two approaches for the HAADF-STEM analysis is discussed.Entities:
Year: 2004 PMID： 15046811 DOI： 10.1016/j.ultramic.2003.08.023
Source DB: PubMed Journal: Ultramicroscopy ISSN： 0304-3991 Impact factor: 2.689