Literature DB >> 15035484

Dispersion of the nonlinear refractive index in sapphire.

Arkady Major1, Fumiyo Yoshino, Irkalis Nikolakakos, J Stewart Aitchison, Peter W E Smith.   

Abstract

The nonlinear refractive index, n2, of sapphire was experimentally measured in the 550-1550-nm wavelength range by use of a picosecond Z-scan technique. It was found that in this spectral region the value of n2 decreases monotonically from approximately 3.3 x 10(-16) to approximately 2.8 x 10(-16) cm2/W. An empirical expression for the wavelength dependence of the nonlinear refractive index in the 270-1550-nm range was obtained.

Year:  2004        PMID: 15035484     DOI: 10.1364/ol.29.000602

Source DB:  PubMed          Journal:  Opt Lett        ISSN: 0146-9592            Impact factor:   3.776


  1 in total

1.  Optical nonlinearities in ultra-silicon-rich nitride characterized using z-scan measurements.

Authors:  Byoung-Uk Sohn; Ju Won Choi; Doris K T Ng; Dawn T H Tan
Journal:  Sci Rep       Date:  2019-07-17       Impact factor: 4.379

  1 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.