Literature DB >> 14960067

Measurement of the influence of dispersion on white-light interferometry.

Pavel Pavlicek1, Jan Soubusta.   

Abstract

White-light interferometry is a well-established method for measuring the height profiles of samples with rough as well as with smooth surfaces. Because white-light interferometry uses broadband light sources, the problem of dispersion arises. Because the optical paths in the two interferometer arms cannot be balanced for all wavelengths, the white-light correlogram is distorted, which interferes with its evaluation. We investigate the influence of setup parameters on the shape of the correlogram. Calculated values are compared with experimental results.

Year:  2004        PMID: 14960067     DOI: 10.1364/ao.43.000766

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  1 in total

1.  Ultrathin picoscale white light interferometer.

Authors:  Sunil Dahiya; Akansha Tyagi; Ankur Mandal; Thomas Pfeifer; Kamal P Singh
Journal:  Sci Rep       Date:  2022-05-23       Impact factor: 4.996

  1 in total

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