Literature DB >> 1481271

Automatic focus correction for spot-scan imaging of tilted specimens.

K H Downing1.   

Abstract

The variation in defocus within an image of a highly tilted specimen can be a serious source of artifact. Spot-scan imaging can be combined with dynamic focusing to greatly reduce this range of defocus. A protocol is described for determining the parameters required for the automatic focus compensation during the recording of a spot-scan image. Images of a gold test specimen demonstrate the efficacy of this procedure in extending the area of the image that contains high-quality data. In case the tilt angle or resolution is high enough that the height difference of the specimen within each small illuminated area is larger than the depth of field, the image must be treated to compensate for the focus variation. The same principle is used as was developed for compensation of conventional images of tilted specimens.

Mesh:

Year:  1992        PMID: 1481271     DOI: 10.1016/0304-3991(92)90015-c

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  3 in total

1.  A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy.

Authors:  Kenneth H Downing; Paul E Mooney
Journal:  Rev Sci Instrum       Date:  2008-04       Impact factor: 1.523

Review 2.  Specimen preparation for electron diffraction of thin crystals.

Authors:  Huaibin Wang; Kenneth H Downing
Journal:  Micron       Date:  2010-05-19       Impact factor: 2.251

3.  Cryoelectron microscopy applications in the study of tubulin structure, microtubule architecture, dynamics and assemblies, and interaction of microtubules with motors.

Authors:  Kenneth H Downing; Eva Nogales
Journal:  Methods Enzymol       Date:  2010       Impact factor: 1.600

  3 in total

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