| Literature DB >> 14692755 |
Kiyohiko Kawai1, Tadao Takada, Takayoshi Nagai, Xichen Cai, Akira Sugimoto, Mamoru Fujitsuka, Tetsuro Majima.
Abstract
The hole transfer causes the long-lived charge-separated state in DNA during the photosensitized one-electron oxidation of DNA. The combination of the transient absorption measurement and DNA damage quantification by HPLC clearly demonstrated that the yield of the DNA damage correlates well with the lifetime of the charge-separated state.Mesh：
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Year: 2003 PMID： 14692755 DOI： 10.1021/ja038309g
Source DB: PubMed Journal: J Am Chem Soc ISSN： 0002-7863 Impact factor: 15.419