| Literature DB >> 14664840 |
Ronald R Martin1, S J Naftel, S Macfie, W Skinner, F Courchesne, Véronique Séguin.
Abstract
Time of flight secondary ion mass spectroscopy has been used to study the metal distribution at the soil/root interface of tree roots extracted from smelter-impacted soils. The results, augmented by scanning electron microscopy, show that the technique is capable of resolving metal distributions at the cellular level. In addition, the distribution of metals between the root plaque and the root interior may be useful in interpreting local metal transport mechanisms.Entities:
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Year: 2004 PMID: 14664840 DOI: 10.1016/j.chemosphere.2003.07.010
Source DB: PubMed Journal: Chemosphere ISSN: 0045-6535 Impact factor: 7.086