Literature DB >> 14504395

Revealing the hidden atom in graphite by low-temperature atomic force microscopy.

Stefan Hembacher1, Franz J Giessibl, Jochen Mannhart, Calvin F Quate.   

Abstract

Carbon, the backbone material of life on Earth, comes in three modifications: diamond, graphite, and fullerenes. Diamond develops tetrahedral sp3 bonds, forming a cubic crystal structure, whereas graphite and fullerenes are characterized by planar sp2 bonds. Polycrystalline graphite is the basis for many products of everyday life: pencils, lubricants, batteries, arc lamps, and brushes for electric motors. In crystalline form, highly oriented pyrolytic graphite is used as a diffracting element in monochromators for x-ray and neutron scattering and as a calibration standard for scanning tunneling microscopy (STM). The graphite surface is easily prepared as a clean atomically flat surface by cleavage. This feature is attractive and is used in many laboratories as the surface of choice for "seeing atoms." Despite the proverbial ease of imaging graphite by STM with atomic resolution, every second atom in the hexagonal surface unit cell remains hidden, and STM images show only a single atom in the unit cell. Here we present measurements with a low-temperature atomic force microscope with pico-Newton force sensitivity that reveal the hidden surface atom.

Entities:  

Mesh:

Substances:

Year:  2003        PMID: 14504395      PMCID: PMC240651          DOI: 10.1073/pnas.2134173100

Source DB:  PubMed          Journal:  Proc Natl Acad Sci U S A        ISSN: 0027-8424            Impact factor:   11.205


  8 in total

1.  Quantum mirages formed by coherent projection of electronic structure

Authors: 
Journal:  Nature       Date:  2000-02-03       Impact factor: 49.962

2.  Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy.

Authors: 
Journal:  Science       Date:  2000-07-21       Impact factor: 47.728

3.  Interatomic forces in scanning tunneling microscopy: Giant corrugations of the graphite surface.

Authors: 
Journal:  Phys Rev Lett       Date:  1986-07-28       Impact factor: 9.161

4.  Atom-selective imaging of the GaAs(110) surface.

Authors: 
Journal:  Phys Rev Lett       Date:  1987-03-23       Impact factor: 9.161

5.  Atomic force microscope.

Authors: 
Journal:  Phys Rev Lett       Date:  1986-03-03       Impact factor: 9.161

6.  Comment on "Interatomic forces in scanning tunneling microscopy: Giant corrugations of the graphite surface"

Authors: 
Journal:  Phys Rev Lett       Date:  1986-12-22       Impact factor: 9.161

7.  Theory and observation of highly asymmetric atomic structure in scanning-tunneling-microscopy images of graphite.

Authors: 
Journal:  Phys Rev B Condens Matter       Date:  1987-05-15

8.  Multiple-tip interpretation of anomalous scanning-tunneling-microscopy images of layered materials.

Authors: 
Journal:  Phys Rev B Condens Matter       Date:  1987-09-15
  8 in total
  8 in total

1.  Detecting elusive surface atoms with atomic force microscopy.

Authors:  Mark C Hersam; Yip-Wah Chung
Journal:  Proc Natl Acad Sci U S A       Date:  2003-10-20       Impact factor: 11.205

2.  Three-dimensional imaging of short-range chemical forces with picometre resolution.

Authors:  Boris J Albers; Todd C Schwendemann; Mehmet Z Baykara; Nicolas Pilet; Marcus Liebmann; Eric I Altman; Udo D Schwarz
Journal:  Nat Nanotechnol       Date:  2009-04-06       Impact factor: 39.213

3.  Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique.

Authors:  Zsolt Majzik; Martin Setvín; Andreas Bettac; Albrecht Feltz; Vladimír Cháb; Pavel Jelínek
Journal:  Beilstein J Nanotechnol       Date:  2012-03-15       Impact factor: 3.649

4.  Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM.

Authors:  Fabien Castanié; Laurent Nony; Sébastien Gauthier; Xavier Bouju
Journal:  Beilstein J Nanotechnol       Date:  2012-04-02       Impact factor: 3.649

5.  Online Determination of Graphene Lattice Orientation Through Lateral Forces.

Authors:  Yu Zhang; Fanhua Yu; Guangyong Li; Lianqing Liu; Guangjie Liu; Zhiyong Zhang; Yuechao Wang; Uchechukwu C Wejinya; Ning Xi
Journal:  Nanoscale Res Lett       Date:  2016-08-02       Impact factor: 4.703

6.  Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis.

Authors:  Omur E Dagdeviren; Udo D Schwarz
Journal:  Beilstein J Nanotechnol       Date:  2017-03-20       Impact factor: 3.649

7.  Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy.

Authors:  Majid Fazeli Jadidi; Umut Kamber; Oğuzhan Gürlü; H Özgür Özer
Journal:  Beilstein J Nanotechnol       Date:  2018-11-28       Impact factor: 3.649

8.  Response to "Critical Assessment of the Evidence for Striped Nanoparticles".

Authors:  Quy Khac Ong; Francesco Stellacci
Journal:  PLoS One       Date:  2015-11-10       Impact factor: 3.240

  8 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.