Literature DB >> 14143916

USE AND IN-CIRCUIT TESTING OF SILICON DIODES FOR SUPPRESSION OF RELAY COIL TRANSIENTS.

M G SASLOW.   

Abstract

Keywords:  EQUIPMENT AND SUPPLIES; PSYCHOLOGY, EXPERIMENTAL

Mesh:

Substances:

Year:  1964        PMID: 14143916      PMCID: PMC1404390          DOI: 10.1901/jeab.1964.7-252

Source DB:  PubMed          Journal:  J Exp Anal Behav        ISSN: 0022-5002            Impact factor:   2.468


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  2 in total

1.  A transient suppression guide.

Authors:  M Rilling; C McDiarmid
Journal:  J Exp Anal Behav       Date:  1965-11       Impact factor: 2.468

2.  Improved solid state delay timer allows inexpensive short interval timing.

Authors:  H Markowitz; M G Saslow
Journal:  J Exp Anal Behav       Date:  1966-11       Impact factor: 2.468

  2 in total

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