Visualization and initial characterization of the titanium boundary of the bone-implant interface of osseointegrated implants.

A simple procedure has allowed consistent visualization of the titanium boundary of the bone-implant interface of osseointegrated titanium implants at the electron microscope level. This was accomplished by embedding the intact bone-implant specimen block with low-viscosity resin prior to removal of the device in preparation for sectioning. The titanium boundary consisted of either a thin, compact amorphous electron dense layer, a broad layer of dense amorphous granules, or both. This material was removed by decalcification in formic acid (prior to embedding) and did not diffract electrons (ie, was noncrystalline). Scanning-transmission electron microscopy-EDX analysis indicated the presence of titanium, calcium, and phosphorus in the electron dense material. Field emission scanning electron microscopy-EDX dot-mapping analysis confirmed the presence of these elements and mapped them to the same locations at the implant-interface boundary.