Literature DB >> 13492100

Simplified treatment of ellipsometry.

J A FAUCHER, G M McMANUS, H J TRURNIT.   

Abstract

Keywords:  OPTICS

Mesh：

Year:  1958        PMID： 13492100     DOI： 10.1364/josa.48.000051

Source DB:  PubMed          Journal:  J Opt Soc Am        ISSN： 0030-3941


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  3 in total

1.  Thin sections. I. A study of section thickness and physical distortion produced during microtomy.

Authors:  L D PEACHEY
Journal:  J Biophys Biochem Cytol       Date:  1958-05-25

2.  Treasure of the Past VII: Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry.

Authors:  F L McCrackin; E Passaglia; R R Stromberg; H L Steinberg
Journal:  J Res Natl Inst Stand Technol       Date:  2001-06-01

3.  Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry.

Authors:  Frank L McCrackin; Elio Passaglia; Robert R Stromberg; Harold L Steinberg
Journal:  J Res Natl Bur Stand A Phys Chem       Date:  1963-08-01
  3 in total

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