Literature DB >> 12906546

Inert gas clusters ejected from bursting bubbles during sputtering.

Klaus Franzreb1, Peter Williams.   

Abstract

Ar(+)(n) cluster ions (n<or=6) produced during prolonged Ar+ ion surface bombardment of various sample materials at room temperature are shown to result from the ejection of neutral argon clusters following the rupture of high-pressure subsurface gas bubbles. Subsequent ion formation is shown to take place by resonant charge exchange with incident primary Ar+ ions in the gas phase up to at least 175 microm above the surface. Xe+2 clusters are similarly produced from Xe+-bombarded solids. The ion intensities of Ar+2 and Xe+2 are found to have a characteristic second-order dependence on primary Ar+ or Xe+ current density.

Entities:  

Year:  2003        PMID: 12906546     DOI: 10.1103/PhysRevLett.91.015501

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  1 in total

1.  Deep depth profiling using gas cluster secondary ion mass spectrometry: Micrometer topography development and effects on depth resolution.

Authors:  Shin Muramoto; Dan Graham
Journal:  Surf Interface Anal       Date:  2021-07-06       Impact factor: 1.702

  1 in total

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