Literature DB >> 12857319

Z1/Z2 defects in 4H-SiC.

T A G Eberlein1, R Jones, P R Briddon.   

Abstract

First-principles calculations are carried out on models for the Z(1)/Z(2) defects in 4H-SiC which are found in as-grown and irradiated n-type material. We show that an interstitial-nitrogen-interstitial-carbon defect is exceptionally thermally stable, bistable, and has negative-U character with donor and acceptor levels close to those attributed to the defect.

Entities:  

Year:  2003        PMID: 12857319     DOI: 10.1103/PhysRevLett.90.225502

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  1 in total

1.  Effect of Various Defects on 4H-SiC Schottky Diode Performance and Its Relation to Epitaxial Growth Conditions.

Authors:  Jinlan Li; Chenxu Meng; Le Yu; Yun Li; Feng Yan; Ping Han; Xiaoli Ji
Journal:  Micromachines (Basel)       Date:  2020-06-24       Impact factor: 2.891

  1 in total

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