| Literature DB >> 12832813 |
B Jiang1, J M Zuo, N Jiang, M O'Keeffe, J C H Spence.
Abstract
The low-order structure factors of rutile (TiO(2)) have been measured with an accuracy of up to 0.09% by quantitative convergent-beam electron diffraction (QCBED). This error is an order of magnitude smaller than that in conventional Bragg X-ray diffraction and equivalent to the accuracy of the X-ray Pendellösung method. It is sufficient to distinguish atomic, covalent and ionic bonding. By refinement of the combined data of low-order reflections measured by electron diffraction with high-order reflections from X-ray diffraction, accurate charge-density maps are obtained and used to understand the role of the 3d electrons in Ti-O bonding. The results are combined with electron energy-loss spectra (EELS) in a study of the electronic structure.Entities:
Year: 2003 PMID: 12832813 DOI: 10.1107/s010876730301122x
Source DB: PubMed Journal: Acta Crystallogr A ISSN: 0108-7673 Impact factor: 2.290