| Literature DB >> 12749562 |
Chang Chang1, Patrick Naulleau, David Attwood.
Abstract
Modern synchrotron beamlines often take the form of critical illumination systems, where an incohrent source of limited spatial extent is re-imaged to an experimental plane of interest. Unique constraints of synchrotron sources and beamline, however, may preclude the use of the simple Zernike approximation for calculating the object-image coherence relationship. Here, we perform a rigorous analysis of the object-image coherence relationship valid for synhrotron beamlines. The analysis shows that beamline aberrations have an effect on the coherence properties. Effects of various low-order aberrations on the coherence properties are explicitly studied.Year: 2003 PMID: 12749562 DOI: 10.1364/ao.42.002506
Source DB: PubMed Journal: Appl Opt ISSN: 1559-128X Impact factor: 1.980