Separating trait effects from trait-specific method effects in multitrait-multimethod models: a multiple-indicator CT-C(M-1) model.

An overview of several models of confirmatory factor analysis for analyzing multitrait-multimethod (MTMM) data and a discussion of their advantages and limitations are provided. A new class of multi-indicator MTMM models combines several strengths and avoids a number of serious shortcomings inherent in previously developed MTMM models. The new models enable researchers to specify and to test trait-specific-method effects. The trait and method concepts composing these models are explained in detail and are contrasted with those of previously developed MTMM models for multiple indicators. The definitions of the models are explained step by step, and a practical empirical application of the models to the measurement of 3 traits x 3 methods is used to demonstrate their advantages and limitations.