| Literature DB >> 12689241 |
R Spolenak1, W L Brown, N Tamura, A A MacDowell, R S Celestre, H A Padmore, B Valek, J C Bravman, T Marieb, H Fujimoto, B W Batterman, J R Patel.
Abstract
Grain-to-grain interactions dominate the plasticity of Al thin films and establish effective length scales smaller than the grain size. We have measured large strain distributions and their changes under plastic strain in 1.5-microm-thick Al 0.5% Cu films using a 0.8-microm-diameter white x-ray probe at the Advanced Light Source. Strain distributions arise not only from the distribution of grain sizes and orientation, but also from the differences in grain shape and from stress environment. Multiple active glide plane domains have been found within single grains. Large grains behave like multiple smaller grains even before a dislocation substructure can evolve.Entities:
Year: 2003 PMID: 12689241 DOI: 10.1103/PhysRevLett.90.096102
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161