Literature DB >> 12689074

Local elastic constants in thin films of an fcc crystal.

Kevin van Workum1, Juan J de Pablo.   

Abstract

In this work we present a formalism for the calculation of the local elastic constants in inhomogeneous systems based on a method of planes. Unlike previous work, this formalism does not require the partitioning of the system into a set of finite volumes over which average elastic constants are calculated. Results for the calculation of the local elastic constants of a nearest-neighbor Lennard-Jones fcc crystal in the bulk and in a thin film are presented. The local constants are calculated at exact planes of the (001) face of the crystal. The average elastic constants of the bulk system are also computed and are consistent with the local constants. Additionally we present the local stress profiles in the thin film when a small uniaxial strain is applied. The resulting stress profile compares favorably with the stress profile predicted via the local elastic constants. The surface melting of a model for argon for which experimental and simulation data are available is also studied within the framework of this formalism.

Entities:  

Year:  2003        PMID: 12689074     DOI: 10.1103/PhysRevE.67.031601

Source DB:  PubMed          Journal:  Phys Rev E Stat Nonlin Soft Matter Phys        ISSN: 1539-3755


  1 in total

Review 1.  AFM Nanotribomechanical Characterization of Thin Films for MEMS Applications.

Authors:  Corina Bîrleanu; Marius Pustan; Florina Șerdean; Violeta Merie
Journal:  Micromachines (Basel)       Date:  2021-12-25       Impact factor: 2.891

  1 in total

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