Literature DB >> 12659260

Profilometry based on two-photon absorption in a silicon avalanche photodiode.

Yosuke Tanaka1, Naoya Sako, Takashi Kurokawa, Hiroyuki Tsuda, Mitsuo Takeda.   

Abstract

A novel profilometry method based on two-photon absorption in a silicon avalanche photodiode is proposed. This method has a wide dynamic range, from millimeters to tens of meters. The principle is experimentally confirmed with a fiber-optic Mach-Zehnder interferometer.

Year:  2003        PMID: 12659260     DOI: 10.1364/ol.28.000402

Source DB:  PubMed          Journal:  Opt Lett        ISSN: 0146-9592            Impact factor:   3.776


  1 in total

Review 1.  Near-infrared sub-bandgap all-silicon photodetectors: state of the art and perspectives.

Authors:  Maurizio Casalino; Giuseppe Coppola; Mario Iodice; Ivo Rendina; Luigi Sirleto
Journal:  Sensors (Basel)       Date:  2010-11-29       Impact factor: 3.576

  1 in total

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