| Literature DB >> 12207510 |
James G Kushmerick1, David B Holt, Steven K Pollack, Mark A Ratner, John C Yang, Terence L Schull, Jawad Naciri, Martin H Moore, Ranganathan Shashidhar.
Abstract
Current-voltage (I-V) characteristics for metal-molecule-metal junctions formed from three classes of molecules measured with a simple crossed-wire molecular electronics test-bed are reported. Junction conductance as a function of molecular structure is consistent with I-V characteristics calculated from extended Hückel theory coupled with a Green's function approach, and can be understood on the basis of bond-length alternation.Entities:
Year: 2002 PMID： 12207510 DOI： 10.1021/ja027090n
Source DB: PubMed Journal: J Am Chem Soc ISSN： 0002-7863 Impact factor: 15.419