Literature DB >> 12198180

Friction traced to the single atom.

Franz J Giessibl1, Markus Herz, Jochen Mannhart.   

Abstract

Friction is caused by dissipative lateral forces that act between macroscopic objects. An improved understanding of friction is therefore expected from measurements of dissipative lateral forces acting between individual atoms. Here we establish atomic resolution of both conservative and dissipative forces by lateral force microscopy, presenting the resolution of atomic defects. The interaction between a single-tip atom that is oscillated parallel to an Si(111)-(7 x 7) surface is measured. A dissipation energy of up to 4 eV per oscillation cycle is found. The dissipation is explained by a "plucking action of one atom on to the other" as described by G. A. Tomlinson in 1929 [Tomlinson, G. A. (1929) Phil. Mag. 7, 905-939].

Entities:  

Year:  2002        PMID: 12198180      PMCID: PMC129388          DOI: 10.1073/pnas.182160599

Source DB:  PubMed          Journal:  Proc Natl Acad Sci U S A        ISSN: 0027-8424            Impact factor:   11.205


  7 in total

1.  Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy.

Authors: 
Journal:  Science       Date:  2000-07-21       Impact factor: 47.728

2.  Energy dissipation in atomic force microscopy and atomic loss processes.

Authors:  P M Hoffmann; S Jeffery; J B Pethica; H O Ozer; A Oral
Journal:  Phys Rev Lett       Date:  2001-12-06       Impact factor: 9.161

3.  Scratching the Surface: Fundamental Investigations of Tribology with Atomic Force Microscopy.

Authors:  Robert W. Carpick; Miquel Salmeron
Journal:  Chem Rev       Date:  1997-06-20       Impact factor: 60.622

4.  Velocity dependence of atomic friction

Authors: 
Journal:  Phys Rev Lett       Date:  2000-02-07       Impact factor: 9.161

5.  Atomic force microscope.

Authors: 
Journal:  Phys Rev Lett       Date:  1986-03-03       Impact factor: 9.161

6.  Atomic-scale friction of a tungsten tip on a graphite surface.

Authors: 
Journal:  Phys Rev Lett       Date:  1987-10-26       Impact factor: 9.161

7.  Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.

Authors:  F J Giessibl
Journal:  Science       Date:  1995-01-06       Impact factor: 47.728

  7 in total
  5 in total

1.  Vectorial scanning force microscopy using a nanowire sensor.

Authors:  Nicola Rossi; Floris R Braakman; Davide Cadeddu; Denis Vasyukov; Gözde Tütüncüoglu; Anna Fontcuberta I Morral; Martino Poggio
Journal:  Nat Nanotechnol       Date:  2016-10-17       Impact factor: 39.213

2.  Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM.

Authors:  Fabien Castanié; Laurent Nony; Sébastien Gauthier; Xavier Bouju
Journal:  Beilstein J Nanotechnol       Date:  2012-04-02       Impact factor: 3.649

3.  Stiffness of sphere-plate contacts at MHz frequencies: dependence on normal load, oscillation amplitude, and ambient medium.

Authors:  Jana Vlachová; Rebekka König; Diethelm Johannsmann
Journal:  Beilstein J Nanotechnol       Date:  2015-03-30       Impact factor: 3.649

4.  Interpreting motion and force for narrow-band intermodulation atomic force microscopy.

Authors:  Daniel Platz; Daniel Forchheimer; Erik A Tholén; David B Haviland
Journal:  Beilstein J Nanotechnol       Date:  2013-01-21       Impact factor: 3.649

5.  Optimal geometry for a quartz multipurpose SPM sensor.

Authors:  Julian Stirling
Journal:  Beilstein J Nanotechnol       Date:  2013-06-17       Impact factor: 3.649

  5 in total

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