| Literature DB >> 11932735 |
Feng Liu1, Paul Rugheimer, E Mateeva, D E Savage, M G Lagally.
Abstract
The nanomechanical properties of thin silicon films will become increasingly critical in semiconductor devices, particularly in the context of substrates that consist of a silicon film on an insulating layer (known as silicon-on-insulator, or SOI, substrates). Here we use very small germanium crystals as a new type of nanomechanical stressor to demonstrate a surprising mechanical behaviour of the thin layer of silicon in SOI substrates, and to show that there is a large local reduction in the viscosity of the oxide on which the silicon layer rests. These findings have implications for the use of SOI substrates in nanoelectronic devices.Entities:
Year: 2002 PMID: 11932735 DOI: 10.1038/416498a
Source DB: PubMed Journal: Nature ISSN: 0028-0836 Impact factor: 49.962