| Literature DB >> 11580637 |
M Yabashi1, K Tamasaku, T Ishikawa.
Abstract
The transverse coherence of x rays was measured with an intensity interferometer using a 120-microeV-bandwidth monochromator operating at 14.41 keV. By analyzing the transverse coherence profiles, a vertical source profile of a 25-m long undulator of SPring-8, as well as the coherence degradation by a phase object in the beam path, were quantitatively characterized.Entities:
Year: 2001 PMID: 11580637 DOI: 10.1103/PhysRevLett.87.140801
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161