| Literature DB >> 11469412 |
M Koguchi1, H Kakibayashi, R Tsuneta, M Yamaoka, T Niino, N Tanaka, K Kase, M Iwaki.
Abstract
A new scanning transmission electron microscope has been developed for three-dimensional (3D) observations of nanostructures. Using double spherical fulcra, accurate eucentric rotation was achieved. Cylindrical specimens for 3D-observation were prepared by a microsampling technique using a focused ion beam. Copper via-holes of a semiconductor memory device and ZnO particles were observed by the 3D-STEM from different directions, and 3D-data of the ZnO particles were successfully reconstructed in a topography mode.Entities:
Year: 2001 PMID: 11469412 DOI: 10.1093/jmicro/50.3.235
Source DB: PubMed Journal: J Electron Microsc (Tokyo) ISSN: 0022-0744