Literature DB >> 11415291

E' centers in amorphous SiO(2) revisited: a new look at an old problem.

T Uchino1, M Takahashi, T Yoko.   

Abstract

We present theoretical evidence that the paramagnetic E' defect centers in amorphous silicon dioxide (a-SiO(2)) do not have the same microscopic structures as those well-defined in the corresponding crystalline counterparts such as alpha-quartz. We then present alternative models of some paramagnetic defects that account for the underlying experimental features of the E'-center variants in a-SiO(2). We suggest that our new model should take the place of the conventional defect model of a-SiO(2).

Entities:  

Year:  2001        PMID: 11415291     DOI: 10.1103/PhysRevLett.86.5522

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  1 in total

1.  Surface molecular structure defects and laser-induced damage threshold of fused silica during a manufacturing process.

Authors:  Yuan Li; Hongwei Yan; Ke Yang; Caizhen Yao; Zhiqiang Wang; Xinshu Zou; Chunyan Yan; Xiaodong Yuan; Xin Ju; Liming Yang
Journal:  Sci Rep       Date:  2017-12-19       Impact factor: 4.379

  1 in total

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