| Literature DB >> 11349141 |
D A Luh1, T Miller, J J Paggel, M Y Chou, T C Chiang.
Abstract
We have studied the structural stability of thin silver films with thicknesses of N = 1 to 15 monolayers, deposited on an Fe(100) substrate. Photoemission spectroscopy results show that films of N = 1, 2, and 5 monolayer thicknesses are structurally stable for temperatures above 800 kelvin, whereas films of other thicknesses are unstable and bifurcate into a film with N +/- 1 monolayer thicknesses at temperatures around 400 kelvin. The results are in agreement with theoretical predictions that consider the electronic energy of the quantum well associated with a particular film thickness as a significant contribution to the film stability.Entities:
Year: 2001 PMID: 11349141 DOI: 10.1126/science.292.5519.1131
Source DB: PubMed Journal: Science ISSN: 0036-8075 Impact factor: 47.728