| Literature DB >> 11329332 |
J de La Figuera1, K Pohl, O R de La Fuente, A K Schmid, N C Bartelt, C B Carter, R Q Hwang.
Abstract
Using scanning tunneling microscopy we have observed thermally induced dislocation glide in monolayer Cu films on Ru(0001) at room temperature. The motion is governed by a Peierls barrier that depends on the detailed structure of the dislocations, in particular upon whether the threading dislocations that terminate them are dissociated or not. Calculations based on the Frenkel-Kontorova model reproduce the threading dislocation structure and provide estimates of the Peierls barrier and dislocation stiffness which are consistent with experiment.Entities:
Year: 2001 PMID: 11329332 DOI: 10.1103/PhysRevLett.86.3819
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161