| Literature DB >> 11308656 |
Abstract
The line tension values of n-octane and 1-octene on a hexadecyltrichlorosilane coated silicon wafer, are determined by contact angle measurements at temperatures near a first-order wetting transition T(w). It is shown experimentally that the line tension changes sign as the temperature increases toward T(w) in agreement with a number of theoretical predictions. A simple phenomenological model possessing a repulsive barrier at l(0)=5.1+/-0.2 nm and a scale factor of B=78+/-6 provides a quantitative description of the experiments.Entities:
Year: 2001 PMID: 11308656 DOI: 10.1103/PhysRevE.63.031601
Source DB: PubMed Journal: Phys Rev E Stat Nonlin Soft Matter Phys ISSN: 1539-3755